Crystallography Open Database

Information card for entry 4115570

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Coordinates	4115570.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	O64 Si32
Calculated formula	O64 Si32
Title of publication	Variable-Temperature Microcrystal X-ray Diffraction Studies of Negative Thermal Expansion in the Pure Silica Zeolite IFR
Authors of publication	Luis A. Villaescusa; Philip Lightfoot; Simon J. Teat; Russell E. Morris
Journal of publication	Journal of the American Chemical Society
Year of publication	2001
Journal volume	123
Pages of publication	5453 - 5459
a	18.6504 ± 0.0013 Å
b	13.4868 ± 0.001 Å
c	7.6257 ± 0.0006 Å
α	90°
β	101.99 ± 0.003°
γ	90°
Cell volume	1876.3 ± 0.2 Å³
Cell temperature	240 ± 2 K
Ambient diffraction temperature	240 ± 2 K
Number of distinct elements	2
Space group number	12
Hermann-Mauguin space group symbol	I 1 2/m 1
Hall space group symbol	-I 2y
Residual factor for all reflections	0.0701
Residual factor for significantly intense reflections	0.0578
Weighted residual factors for significantly intense reflections	0.128
Weighted residual factors for all reflections included in the refinement	0.1296
Goodness-of-fit parameter for all reflections included in the refinement	2.107
Diffraction radiation wavelength	0.6944 Å
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
178926 (current)	2016-03-22	cif/4/11/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/11/55.	4115570.cif
120077	2014-07-12	Adding DOIs to range 4/11 structures.	4115570.cif
69162	2012-12-03	cif/ Adding structures of 4115570 via cif-deposit CGI script.	4115570.cif