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Information card for entry 4125746
Preview
| Coordinates | 4125746.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H34 N2 O4 |
|---|---|
| Calculated formula | C44 H34 N2 O4 |
| SMILES | c1c2c3c(ccc4c3c(c1)c1ccc3c5c(ccc4c15)C(=O)N(C3=O)C(CC)CC)c1ccc3c4c(ccc2c14)C(=O)N(C3=O)C(CC)CC |
| Title of publication | Direct Observation of a Charge-Transfer State Preceding High-Yield Singlet Fission in Terrylenediimide Thin Films. |
| Authors of publication | Margulies, Eric A.; Logsdon, Jenna L.; Miller, Claire E.; Ma, Lin; Simonoff, Ethan; Young, Ryan M.; Schatz, George C.; Wasielewski, Michael R. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| Journal volume | 139 |
| Journal issue | 2 |
| Pages of publication | 663 - 671 |
| a | 22.34 ± 0.0012 Å |
| b | 16.695 ± 0.0009 Å |
| c | 8.3236 ± 0.0004 Å |
| α | 90° |
| β | 103.833 ± 0.002° |
| γ | 90° |
| Cell volume | 3014.4 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 99.99 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0472 |
| Residual factor for significantly intense reflections | 0.0401 |
| Weighted residual factors for significantly intense reflections | 0.1106 |
| Weighted residual factors for all reflections included in the refinement | 0.1168 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 193122 (current) | 2017-03-04 | cif/ Adding structures of 4125746 via cif-deposit CGI script. |
4125746.cif |
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Users of the data should acknowledge the original authors of the
structural data.