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Information card for entry 4127421
Preview
| Coordinates | 4127421.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As32 Eu15 In22 |
|---|---|
| Calculated formula | As32 Eu15 In22 |
| Title of publication | Supertetrahedral Layers Based on GaAs or InAs. |
| Authors of publication | Weippert, Valentin; Haffner, Arthur; Stamatopoulos, Alexis; Johrendt, Dirk |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 28 |
| Pages of publication | 11245 - 11252 |
| a | 23.703 ± 0.002 Å |
| b | 23.702 ± 0.002 Å |
| c | 22.337 ± 0.002 Å |
| α | 90° |
| β | 113.473 ± 0.002° |
| γ | 90° |
| Cell volume | 11510.7 ± 1.7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0749 |
| Residual factor for significantly intense reflections | 0.0553 |
| Weighted residual factors for significantly intense reflections | 0.1499 |
| Weighted residual factors for all reflections included in the refinement | 0.164 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 220694 (current) | 2019-11-02 | cif/ Adding structures of 4127421 via cif-deposit CGI script. |
4127421.cif |
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Users of the data should acknowledge the original authors of the
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