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Information card for entry 4127433
Preview
| Coordinates | 4127433.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C82.24 H134.13 Ag15 Cl F17 N10.64 O19.64 S8 |
|---|---|
| Calculated formula | C82.2454 H132.128 Ag15 Cl F17.0001 N10.6373 O19.6373 S8 |
| Title of publication | Assembly of Atomically Precise Silver Nanoclusters into Nanocluster-Based Frameworks. |
| Authors of publication | Alhilaly, Mohammad J.; Huang, Ren-Wu; Naphade, Rounak; Alamer, Badriah; Hedhili, Mohamed Nejib; Emwas, Abdul-Hamid; Maity, Partha; Yin, Jun; Shkurenko, Aleksander; Mohammed, Omar F.; Eddaoudi, Mohamed; Bakr, Osman M. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 24 |
| Pages of publication | 9585 - 9592 |
| a | 15.009 ± 0.002 Å |
| b | 19.593 ± 0.003 Å |
| c | 22.379 ± 0.003 Å |
| α | 96.761 ± 0.004° |
| β | 101.558 ± 0.004° |
| γ | 98.432 ± 0.004° |
| Cell volume | 6304 ± 1.5 Å3 |
| Cell temperature | 120 ± 0.1 K |
| Ambient diffraction temperature | 120 ± 0.1 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0737 |
| Residual factor for significantly intense reflections | 0.0688 |
| Weighted residual factors for significantly intense reflections | 0.1704 |
| Weighted residual factors for all reflections included in the refinement | 0.1729 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.091 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 220706 (current) | 2019-11-02 | cif/ Adding structures of 4127433 via cif-deposit CGI script. |
4127433.cif |
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Users of the data should acknowledge the original authors of the
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