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Information card for entry 4127955
Preview
Coordinates | 4127955.cif |
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Original paper (by DOI) | HTML |
Formula | Bi2.72 Cs1.03 Mn1.28 S6 |
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Calculated formula | Bi2.7204 Cs1.03 Mn1.2796 S6 |
Title of publication | K<sub> <i>x</i> </sub>[Bi<sub>4-<i>x</i></sub>Mn<sub> <i>x</i> </sub>S<sub>6</sub>], Design of a Highly Selective Ion Exchange Material and Direct Gap 2D Semiconductor. |
Authors of publication | Wang, Ruiqi; Chen, Haijie; Xiao, Yi; Hadar, Ido; Bu, Kejun; Zhang, Xian; Pan, Jie; Gu, Yuhao; Guo, Zhongnan; Huang, Fuqiang; Kanatzidis, Mercouri G. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 42 |
Pages of publication | 16903 - 16914 |
a | 3.9548 ± 0.00012 Å |
b | 3.9548 ± 0.00012 Å |
c | 24.0993 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 326.43 ± 0.02 Å3 |
Cell temperature | 180 ± 0.1 K |
Ambient diffraction temperature | 180 ± 0.1 K |
Number of distinct elements | 4 |
Space group number | 194 |
Hermann-Mauguin space group symbol | P 63/m m c |
Hall space group symbol | -P 6c 2c |
Residual factor for all reflections | 0.0344 |
Residual factor for significantly intense reflections | 0.0337 |
Weighted residual factors for significantly intense reflections | 0.0828 |
Weighted residual factors for all reflections included in the refinement | 0.0833 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.274 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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221107 (current) | 2019-11-02 | cif/ Adding structures of 4127955 via cif-deposit CGI script. |
4127955.cif |
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