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Information card for entry 4128083
Preview
| Coordinates | 4128083.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C47 H62 Br N Ni O P2 |
|---|---|
| Calculated formula | C47 H62 Br N Ni O P2 |
| SMILES | Br[Ni]1([P](c2c3Oc4c(cccc4[P]1(C(C)(C)C)C(C)(C)C)C(c3ccc2)(C)C)(C(C)(C)C)C(C)(C)C)c1ccc(n2cccc2)cc1.c1ccccc1 |
| Title of publication | Mechanistic Characterization of (Xantphos)Ni(I)-Mediated Alkyl Bromide Activation: Oxidative Addition, Electron Transfer, or Halogen-Atom Abstraction. |
| Authors of publication | Diccianni, Justin B.; Katigbak, Joseph; Hu, Chunhua; Diao, Tianning |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 4 |
| Pages of publication | 1788 - 1796 |
| a | 12.0624 ± 0.0011 Å |
| b | 21.708 ± 0.002 Å |
| c | 16.2095 ± 0.0015 Å |
| α | 90° |
| β | 91.1201 ± 0.0017° |
| γ | 90° |
| Cell volume | 4243.7 ± 0.7 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0664 |
| Residual factor for significantly intense reflections | 0.0452 |
| Weighted residual factors for significantly intense reflections | 0.1019 |
| Weighted residual factors for all reflections included in the refinement | 0.1116 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 221214 (current) | 2019-11-03 | cif/ Adding structures of 4128083 via cif-deposit CGI script. |
4128083.cif |
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Users of the data should acknowledge the original authors of the
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