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Information card for entry 4128986
Preview
| Coordinates | 4128986.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | copper iodide triselenide |
|---|---|
| Formula | Cu2 I2 Se6 |
| Calculated formula | Cu2.00067 I2 Se6 |
| Title of publication | Pressure-Induced Superconductivity and Flattened Se<sub>6</sub> Rings in the Wide Band Gap Semiconductor Cu<sub>2</sub>I<sub>2</sub>Se<sub>6</sub>. |
| Authors of publication | Cai, Weizhao; Lin, Wenwen; Li, Long-Hua; Malliakas, Christos D.; Zhang, Rong; Groesbeck, Matthew; Bao, Jin-Ke; Zhang, Dongzhou; Sterer, Eran; Kanatzidis, Mercouri G.; Deemyad, Shanti |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 38 |
| Pages of publication | 15174 - 15182 |
| a | 12.7831 ± 0.0007 Å |
| b | 12.7831 ± 0.0007 Å |
| c | 10.596 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 1499.5 ± 0.3 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Cell measurement pressure | 35800000 kPa |
| Number of distinct elements | 3 |
| Space group number | 166 |
| Hermann-Mauguin space group symbol | R -3 m :H |
| Hall space group symbol | -R 3 2" |
| Residual factor for all reflections | 0.0651 |
| Residual factor for significantly intense reflections | 0.0651 |
| Weighted residual factors for significantly intense reflections | 0.1739 |
| Weighted residual factors for all reflections included in the refinement | 0.1739 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.275 |
| Diffraction radiation wavelength | 0.4325 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 222005 (current) | 2019-11-03 | cif/ Adding structures of 4128974, 4128975, 4128976, 4128977, 4128978, 4128979, 4128980, 4128981, 4128982, 4128983, 4128984, 4128985, 4128986 via cif-deposit CGI script. |
4128986.cif |
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Users of the data should acknowledge the original authors of the
structural data.