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Information card for entry 4130842
Preview
Coordinates | 4130842.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H46 As2 D12 N4 Si2 |
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Calculated formula | C42 H46 As2 D12 N4 Si2 |
SMILES | [As]1=[Si]2([N](=C(c3ccccc3)N2C(C)(C)C)C(C)(C)C)[As]=[Si]21[N](=C(c1ccccc1)N2C(C)(C)C)C(C)(C)C.c1(c(c(c(c(c1[2H])[2H])[2H])[2H])[2H])[2H].c1(c(c(c(c(c1[2H])[2H])[2H])[2H])[2H])[2H] |
Title of publication | Pnictogen-Silicon Analogues of Benzene. |
Authors of publication | Seitz, Andreas E.; Eckhardt, Maria; Erlebach, Andreas; Peresypkina, Eugenia V.; Sierka, Marek; Scheer, Manfred |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 33 |
Pages of publication | 10433 - 10436 |
a | 9.29 ± 0.0006 Å |
b | 9.9536 ± 0.0006 Å |
c | 12.5142 ± 0.0008 Å |
α | 69.954 ± 0.006° |
β | 77.338 ± 0.005° |
γ | 86.516 ± 0.005° |
Cell volume | 1060.5 ± 0.12 Å3 |
Cell temperature | 123 ± 1 K |
Ambient diffraction temperature | 123 ± 1 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0307 |
Residual factor for significantly intense reflections | 0.0275 |
Weighted residual factors for significantly intense reflections | 0.0765 |
Weighted residual factors for all reflections included in the refinement | 0.0791 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.143 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
241201 (current) | 2019-11-25 | cif/ Adding structures of 4130842 via cif-deposit CGI script. |
4130842.cif |
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Users of the data should acknowledge the original authors of the
structural data.