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Information card for entry 4131591
Preview
| Coordinates | 4131591.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H28 Cl4 Cu2 N2 O2 |
|---|---|
| Calculated formula | C16 H28 Cl4 Cu2 N2 O2 |
| SMILES | [N]12(O[Cu]31(Cl)[Cl][Cu]1([N]4(C5CCCC4CCC5)O1)(Cl)[Cl]3)C1CCCC2CCC1 |
| Title of publication | Electronic Structural Analysis of Copper(II)-TEMPO/ABNO Complexes Provides Evidence for Copper(I)-Oxoammonium Character. |
| Authors of publication | Walroth, Richard C.; Miles, Kelsey C.; Lukens, James T.; MacMillan, Samantha N.; Stahl, Shannon S.; Lancaster, Kyle M. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| Journal volume | 139 |
| Journal issue | 38 |
| Pages of publication | 13507 - 13517 |
| a | 6.8286 ± 0.0001 Å |
| b | 13.2674 ± 0.0003 Å |
| c | 11.3528 ± 0.0002 Å |
| α | 90° |
| β | 90.371 ± 0.001° |
| γ | 90° |
| Cell volume | 1028.52 ± 0.03 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0172 |
| Residual factor for significantly intense reflections | 0.0161 |
| Weighted residual factors for significantly intense reflections | 0.0465 |
| Weighted residual factors for all reflections included in the refinement | 0.047 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.099 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 241768 (current) | 2019-11-25 | cif/ Adding structures of 4131591 via cif-deposit CGI script. |
4131591.cif |
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Users of the data should acknowledge the original authors of the
structural data.