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Information card for entry 4131765
Preview
| Coordinates | 4131765.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C62 H106 Bi2 N4 O2 S Si4 |
|---|---|
| Calculated formula | C62 H106 Bi2 N4 O2 S Si4 |
| Title of publication | Bismuth(III) Complex of the [S<sub>4</sub>]<sup>•-</sup> Radical Anion: Dimer Formation via Pancake Bonds. |
| Authors of publication | Schwamm, Ryan J.; Lein, Matthias; Coles, Martyn P.; Fitchett, Christopher M. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| Journal volume | 139 |
| Journal issue | 46 |
| Pages of publication | 16490 - 16493 |
| a | 18.2632 ± 0.0003 Å |
| b | 17.7081 ± 0.0003 Å |
| c | 21.6183 ± 0.0003 Å |
| α | 90° |
| β | 100.067 ± 0.0013° |
| γ | 90° |
| Cell volume | 6883.85 ± 0.19 Å3 |
| Cell temperature | 120 ± 0.1 K |
| Ambient diffraction temperature | 120 ± 0.1 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0467 |
| Residual factor for significantly intense reflections | 0.0287 |
| Weighted residual factors for significantly intense reflections | 0.0561 |
| Weighted residual factors for all reflections included in the refinement | 0.0631 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 241933 (current) | 2019-11-25 | cif/ Adding structures of 4131765, 4131766, 4131767, 4131768, 4131769, 4131770, 4131771, 4131772, 4131773, 4131774, 4131775, 4131776, 4131777 via cif-deposit CGI script. |
4131765.cif |
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Users of the data should acknowledge the original authors of the
structural data.