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Information card for entry 4133982
Preview
| Coordinates | 4133982.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ga27 Rb8 Sb19 |
|---|---|
| Calculated formula | Ga27 Rb8 Sb19 |
| Title of publication | III-V Clathrate Semiconductors with Outstanding Hole Mobility: Cs<sub>8</sub>In<sub>27</sub>Sb<sub>19</sub> and <i>A</i><sub>8</sub>Ga<sub>27</sub>Sb<sub>19</sub> (<i>A</i> = Cs, Rb). |
| Authors of publication | Owens-Baird, Bryan; Wang, Jian; Wang, Suyin Grass; Chen, Yu-Sheng; Lee, Shannon; Donadio, Davide; Kovnir, Kirill |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2020 |
| Journal volume | 142 |
| Journal issue | 4 |
| Pages of publication | 2031 - 2041 |
| a | 22.8962 ± 0.00004 Å |
| b | 22.8962 ± 0.00004 Å |
| c | 22.8962 ± 0.00004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 12003 ± 0.04 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 206 |
| Hermann-Mauguin space group symbol | I a -3 |
| Hall space group symbol | -I 2b 2c 3 |
| Residual factor for all reflections | 0.0514 |
| Residual factor for significantly intense reflections | 0.0426 |
| Weighted residual factors for all reflections | 0.0508 |
| Weighted residual factors for significantly intense reflections | 0.0499 |
| Goodness-of-fit parameter for all reflections | 1.32 |
| Method of determination | powder diffraction |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.41275 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 247530 (current) | 2020-02-04 | cif/ Updating files of 4133982, 4133983, 4133984, 4133985 Original log message: Adding full bibliography for 4133982--4133985.cif. |
4133982.cif |
| 246975 | 2020-01-18 | cif/ Adding structures of 4133982 via cif-deposit CGI script. |
4133982.cif |
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Users of the data should acknowledge the original authors of the
structural data.