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Information card for entry 4331711
Preview
| Coordinates | 4331711.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As F11 H3 N Te |
|---|---|
| Calculated formula | As F11 H3 N Te |
| Title of publication | Syntheses of [F5TeNH3][AsF6], [F5TeN(H)Xe][AsF6], and F5TeNF2and Characterization by Multi-NMR and Raman Spectroscopy and by Electronic Structure Calculations: The X-ray Crystal Structures of α- and β-F5TeNH2, [F5TeNH3][AsF6], and [F5TeN(H)Xe][AsF6] |
| Authors of publication | Fir, Barbara; Whalen, J. Marc; Mercier, Hélène P. A.; Dixon, David A.; Schrobilgen, Gary J. |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 5 |
| Pages of publication | 1978 - 1996 |
| a | 6.6397 ± 0.0002 Å |
| b | 17.0068 ± 0.0001 Å |
| c | 11.1684 ± 0.0003 Å |
| α | 90° |
| β | 105.636 ± 0.002° |
| γ | 90° |
| Cell volume | 1214.47 ± 0.05 Å3 |
| Cell temperature | 164 ± 2 K |
| Ambient diffraction temperature | 164 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 11 |
| Hermann-Mauguin space group symbol | P 1 21/m 1 |
| Hall space group symbol | -P 2yb |
| Residual factor for all reflections | 0.0335 |
| Residual factor for significantly intense reflections | 0.0271 |
| Weighted residual factors for significantly intense reflections | 0.0735 |
| Weighted residual factors for all reflections included in the refinement | 0.0763 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 176467 (current) | 2016-02-16 | cif/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in range 4. |
4331711.cif |
| 97824 | 2014-01-29 | cif/ Adding structures of 4331711, 4331712, 4331713, 4331714 via cif-deposit CGI script. |
4331711.cif |
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Users of the data should acknowledge the original authors of the
structural data.