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Information card for entry 4344591
Preview
| Coordinates | 4344591.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C71.67 H103.96 Cl3.67 F12 N8 Ni2 O2.17 Sb2 |
|---|---|
| Calculated formula | C71.66 H103.948 Cl3.66 F12 N8 Ni2 O2.17 Sb2 |
| Title of publication | Geometric and Electronic Structures of Nickel(II) Complexes of Redox Noninnocent Tetradentate Phenylenediamine Ligands. |
| Authors of publication | Ciccione, Jérémie; Leconte, Nicolas; Luneau, Dominique; Philouze, Christian; Thomas, Fabrice |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 2 |
| Pages of publication | 649 - 665 |
| a | 42.949 ± 0.009 Å |
| b | 16.025 ± 0.003 Å |
| c | 26.266 ± 0.005 Å |
| α | 90° |
| β | 102.82 ± 0.03° |
| γ | 90° |
| Cell volume | 17627 ± 6 Å3 |
| Cell temperature | 200 K |
| Ambient diffraction temperature | 200 K |
| Number of distinct elements | 8 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1308 |
| Residual factor for significantly intense reflections | 0.082 |
| Weighted residual factors for significantly intense reflections | 0.2196 |
| Weighted residual factors for all reflections included in the refinement | 0.2685 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 175517 (current) | 2016-02-04 | cif/ Adding structures of 4344587, 4344588, 4344589, 4344590, 4344591, 4344592, 4344593, 4344594, 4344595, 4344596 via cif-deposit CGI script. |
4344591.cif |
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Users of the data should acknowledge the original authors of the
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