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Information card for entry 4346692
Preview
| Coordinates | 4346692.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21 H24 Cl Co Cu N7 |
|---|---|
| Calculated formula | C21 H24 Cl Co Cu N7 |
| SMILES | [Cu]123([Co]456N(c7[n]1cccc7)CC[N]4(CCN5c1[n]2cccc1)CCN6c1[n]3cccc1)Cl |
| Title of publication | Influence of Copper Oxidation State on the Bonding and Electronic Structure of Cobalt-Copper Complexes. |
| Authors of publication | Eisenhart, Reed J.; Carlson, Rebecca K.; Clouston, Laura J.; Young, Jr, Victor G; Chen, Yu-Sheng; Bill, Eckhard; Gagliardi, Laura; Lu, Connie C. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 23 |
| Pages of publication | 11330 - 11338 |
| a | 14.6118 ± 0.0009 Å |
| b | 9.9196 ± 0.0006 Å |
| c | 14.6848 ± 0.0009 Å |
| α | 90° |
| β | 101.347 ± 0.001° |
| γ | 90° |
| Cell volume | 2086.9 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0357 |
| Residual factor for significantly intense reflections | 0.029 |
| Weighted residual factors for significantly intense reflections | 0.068 |
| Weighted residual factors for all reflections included in the refinement | 0.072 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
| Diffraction radiation wavelength | 0.41328 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 231927 (current) | 2019-11-23 | cif/ Adding structures of 4346692, 4346693, 4346694 via cif-deposit CGI script. |
4346692.cif |
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Users of the data should acknowledge the original authors of the
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