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Information card for entry 4348350
Preview
| Coordinates | 4348350.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H32 N4 O20 U4 |
|---|---|
| Calculated formula | C28 H26 N4 O20 U4 |
| SMILES | c1cc2c(nccc2)c2c1cccn2.O=[U]123([O]=C(O[U]4(=O)(=O)O[U]5(=O)(=O)([O]2[U](=O)(=O)(O1)[O]=C(O5)C)([O]34)[OH2])C)(=O)[OH2].O.c1ccc2ccc3cccnc3c2n1.O |
| Title of publication | Combining coordination and supramolecular chemistry to explore uranyl assembly in the solid state |
| Authors of publication | Carter, Korey P.; Cahill, Christopher L. |
| Journal of publication | Inorganic Chemistry Frontiers |
| Year of publication | 2015 |
| Journal volume | 2 |
| Journal issue | 2 |
| Pages of publication | 141 |
| a | 7.576 ± 0.006 Å |
| b | 15.177 ± 0.006 Å |
| c | 16.86 ± 0.007 Å |
| α | 90° |
| β | 102.094 ± 0.006° |
| γ | 90° |
| Cell volume | 1895.6 ± 1.9 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0265 |
| Residual factor for significantly intense reflections | 0.0204 |
| Weighted residual factors for significantly intense reflections | 0.044 |
| Weighted residual factors for all reflections included in the refinement | 0.0453 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 232884 (current) | 2019-11-23 | cif/ Adding structures of 4348347, 4348348, 4348349, 4348350, 4348351, 4348352, 4348353, 4348354, 4348355, 4348356, 4348357, 4348358 via cif-deposit CGI script. |
4348350.cif |
All data in the COD and the database itself are dedicated to the
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Users of the data should acknowledge the original authors of the
structural data.