Crystallography Open Database

Information card for entry 4349382

Preview

Coordinates	4349382.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C32 H66 Fe Ga2 N2 Si4
Calculated formula	C32 H66 Fe Ga2 N2 Si4
SMILES	C[Si](C)(C)N([Fe]([Ga]1234[c]5([c]1([c]2([c]3([c]45C)C)C)C)C)(N([Si](C)(C)C)[Si](C)(C)C)[Ga]1234[c]5([c]1([c]2([c]3([c]45C)C)C)C)C)[Si](C)(C)C
Title of publication	Diverse Reactivity of ECp* (E = Al, Ga) toward Low-Coordinate Transition Metal Amides [TM(N(SiMe<sub>3</sub>)<sub>2</sub>)<sub>2</sub>] (TM = Fe, Co, Zn): Insertion, Cp* Transfer, and Orthometalation.
Authors of publication	Weßing, Jana; Göbel, Christoph; Weber, Birgit; Gemel, Christian; Fischer, Roland A.
Journal of publication	Inorganic chemistry
Year of publication	2017
Journal volume	56
Journal issue	6
Pages of publication	3517 - 3525
a	16.3997 ± 0.0003 Å
b	15.1616 ± 0.0002 Å
c	16.9223 ± 0.0003 Å
α	90°
β	90°
γ	90°
Cell volume	4207.66 ± 0.12 Å³
Cell temperature	112 K
Ambient diffraction temperature	112 K
Number of distinct elements	6
Space group number	60
Hermann-Mauguin space group symbol	P b c n
Hall space group symbol	-P 2n 2ab
Residual factor for all reflections	0.0282
Residual factor for significantly intense reflections	0.0252
Weighted residual factors for significantly intense reflections	0.0663
Weighted residual factors for all reflections included in the refinement	0.0683
Goodness-of-fit parameter for all reflections included in the refinement	1.037
Diffraction radiation probe	x-ray
Diffraction radiation wavelength	1.54184 Å
Diffraction radiation type	CuKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
233911 (current)	2019-11-23	cif/ Adding structures of 4349380, 4349381, 4349382, 4349383, 4349384 via cif-deposit CGI script.	4349382.cif