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Information card for entry 4350818
Preview
| Coordinates | 4350818.cif | 
|---|---|
| Original paper (by DOI) | HTML | 
| Formula | Cu22 S32 Sn10 | 
|---|---|
| Calculated formula | Cu21.812 S32 Sn10.188 | 
| Title of publication | Local-disorder-induced low thermal conductivity in degenerate semiconductor Cu22Sn10S32 | 
| Authors of publication | Pavan Kumar, V.; Lemoine, P.; Carnevali, V.; Guelou, G.; Lebedev, O.I.; Raveau, B.; Al Rahal Al Orabi, R.; Fornari, M.; Candolfi, C.; Prestipino, C.; Menut, D.; Malaman, B.; Juraszek, J.; Suekuni, K.; Guilmeau, E. | 
| Journal of publication | Inorganic Chemistry | 
| Year of publication | 2021 | 
| Journal volume | 60 | 
| Journal issue | 21 | 
| Pages of publication | 16273 - 16285 | 
| a | 10.82345 ± 0.00003 Å | 
| b | 10.82345 ± 0.00003 Å | 
| c | 10.82345 ± 0.00003 Å | 
| α | 90° | 
| β | 90° | 
| γ | 90° | 
| Cell volume | 1267.94 ± 0.006 Å3 | 
| Cell temperature | 293 ± 2 K | 
| Ambient diffraction temperature | 293 ± 2 K | 
| Number of distinct elements | 3 | 
| Space group number | 218 | 
| Hermann-Mauguin space group symbol | P -4 3 n | 
| Hall space group symbol | P -4n 2 3 | 
| Residual factor R(I) for significantly intense reflections | 81.8604 | 
| Method of determination | powder diffraction | 
| Diffraction radiation wavelength | 0.72733 Å | 
| Diffraction radiation type | MARSbeamline,SOLEIL | 
| Has coordinates | Yes | 
| Has disorder | No | 
| Has Fobs | No | 
| Revision | Date | Message | Files | 
|---|---|---|---|
| 280697 (current) | 2023-01-31 | cif/ Adding structures of 4350818 via cif-deposit CGI script. | 4350818.cif | 
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          structural data.