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Information card for entry 4514454
Preview
| Coordinates | 4514454.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H46 N2 S4 |
|---|---|
| Calculated formula | C42 H46 N2 S4 |
| Title of publication | Influences of Structural Modification of S, N-Hexacenes on the Morphology and OFET Characteristics. |
| Authors of publication | Huang, Yi-Fan; Wang, Chun-Kai; Lai, Bo-Han; Chung, Chin-Lung; Chen, Chin-Yi; Ciou, Guan-Ting; Wong, Ken-Tsung; Wang, Chien-Lung |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2019 |
| Journal volume | 11 |
| Journal issue | 24 |
| Pages of publication | 21756 - 21765 |
| a | 15.9364 ± 0.001 Å |
| b | 8.7847 ± 0.0004 Å |
| c | 26.9921 ± 0.0019 Å |
| α | 90° |
| β | 102.532 ± 0.007° |
| γ | 90° |
| Cell volume | 3688.8 ± 0.4 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.141 |
| Residual factor for significantly intense reflections | 0.0789 |
| Weighted residual factors for significantly intense reflections | 0.1991 |
| Weighted residual factors for all reflections included in the refinement | 0.2616 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 219643 (current) | 2019-10-28 | cif/ Adding structures of 4514454 via cif-deposit CGI script. |
4514454.cif |
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Users of the data should acknowledge the original authors of the
structural data.