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Information card for entry 4517231
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| Coordinates | 4517231.cif |
|---|---|
| Structure factors | 4517231.hkl |
| Original paper (by DOI) | HTML |
| Chemical name | phosphangulene oxide : phosphangulene 0.50:0.50 |
|---|---|
| Formula | C18 H9 O3.5 P |
| Calculated formula | C18 H9 O3.504 P |
| Title of publication | Foiling Normal Patterns of Crystallization by Design. Polymorphism of Phosphangulene Chalcogenides |
| Authors of publication | Alice Heskia; Thierry Maris; James D. Wuest |
| Journal of publication | Cryst. Growth & Design |
| Year of publication | 2019 |
| Journal volume | 19 |
| Pages of publication | 5390 - 5406 |
| a | 12.0382 ± 0.0008 Å |
| b | 7.4286 ± 0.0005 Å |
| c | 29.694 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2655.4 ± 0.3 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0646 |
| Residual factor for significantly intense reflections | 0.0624 |
| Weighted residual factors for significantly intense reflections | 0.162 |
| Weighted residual factors for all reflections included in the refinement | 0.1636 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.152 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.34139 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 245439 (current) | 2019-12-20 | cif/ hkl/ Adding structures of 4517231 via cif-deposit CGI script. |
4517231.cif 4517231.hkl |
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