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Information card for entry 7045808
Preview
| Coordinates | 7045808.cif | 
|---|---|
| Original paper (by DOI) | HTML | 
| Formula | C18 H40 N6 Sn Te | 
|---|---|
| Calculated formula | C18 H40 N6 Sn Te | 
| Title of publication | Tin Guanidinato Complexes: Oxidative Control of Sn, SnS, SnSe and SnTe Thin Film Deposition | 
| Authors of publication | Johnson, Andrew Lee; Ahmet, Ibrahim Y.; Hill, Michael S.; Raithby, Paul R. | 
| Journal of publication | Dalton Transactions | 
| Year of publication | 2018 | 
| a | 14.6986 ± 0.0003 Å | 
| b | 9.269 ± 0.0002 Å | 
| c | 18.3539 ± 0.0004 Å | 
| α | 90° | 
| β | 97.487 ± 0.001° | 
| γ | 90° | 
| Cell volume | 2479.24 ± 0.09 Å3 | 
| Cell temperature | 150 ± 2 K | 
| Ambient diffraction temperature | 150 ± 2 K | 
| Number of distinct elements | 5 | 
| Space group number | 14 | 
| Hermann-Mauguin space group symbol | P 1 21/a 1 | 
| Hall space group symbol | -P 2yab | 
| Residual factor for all reflections | 0.0479 | 
| Residual factor for significantly intense reflections | 0.0346 | 
| Weighted residual factors for significantly intense reflections | 0.0801 | 
| Weighted residual factors for all reflections included in the refinement | 0.0866 | 
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 | 
| Diffraction radiation wavelength | 0.71073 Å | 
| Diffraction radiation type | MoKα | 
| Has coordinates | Yes | 
| Has disorder | Yes | 
| Has Fobs | No | 
| Revision | Date | Message | Files | 
|---|---|---|---|
| 278046 (current) | 2022-09-21 | cod/ Updated space group information using the 'cif_filter' program. | 7045808.cif | 
| 206829 | 2018-03-08 | cif/ Adding structures of 7045805, 7045806, 7045807, 7045808, 7045809, 7045810, 7045811, 7045812, 7045813, 7045814 via cif-deposit CGI script. | 7045808.cif | 
          All data in the COD and the database itself are dedicated to the
          public domain and licensed under the
          
    CC0
    License
.
          Users of the data should acknowledge the original authors of the
          structural data.