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Information card for entry 7126967
Preview
| Coordinates | 7126967.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C29 H22 F2 N4 O |
|---|---|
| Calculated formula | C29 H22 F2 N4 O |
| SMILES | Fc1cc2C(/C(=C/C3C(/C(C=3[O-])=C/C3=[NH+]c4c(C3(C)C)cc(F)cc4)=C(C#N)C#N)Nc2cc1)(C)C |
| Title of publication | Hydrogen bond-rigidified planar squaraine dye and its electronic and organic semiconductor properties. |
| Authors of publication | Maeda, Takeshi; Liess, Andreas; Kudzus, Astrid; Krause, Ana-Maria; Stolte, Matthias; Amitani, Hitoshi; Yagi, Shigeyuki; Fujiwara, Hideki; Würthner, Frank |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2020 |
| Journal volume | 56 |
| Journal issue | 68 |
| Pages of publication | 9890 - 9893 |
| a | 10.041 ± 0.0016 Å |
| b | 11.3867 ± 0.0019 Å |
| c | 11.654 ± 0.003 Å |
| α | 85.675 ± 0.009° |
| β | 81.578 ± 0.008° |
| γ | 68.373 ± 0.006° |
| Cell volume | 1225 ± 0.4 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for significantly intense reflections | 0.0444 |
| Weighted residual factors for all reflections included in the refinement | 0.0543 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 256014 (current) | 2020-09-06 | cif/ Updating files of 7126966, 7126967 Original log message: Adding full bibliography for 7126966--7126967.cif. |
7126967.cif |
| 254529 | 2020-07-24 | cif/ Adding structures of 7126966, 7126967 via cif-deposit CGI script. |
7126967.cif |
All data in the COD and the database itself are dedicated to the
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Users of the data should acknowledge the original authors of the
structural data.