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Information card for entry 7220860
Preview
Coordinates | 7220860.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H49 Cl3 Ga N S2 Si2 |
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Calculated formula | C32 H49 Cl3 Ga N S2 Si2 |
SMILES | [Ga]12(c3c(c4sc([Si](C)(C)C)cc24)sc([Si](C)(C)C)c3)c2c(cc(C(C)(C)C)cc2C(C)(C)C)C[N]1(C)C.ClC(Cl)Cl |
Title of publication | High HOMO levels and narrow energy band gaps of dithienogalloles |
Authors of publication | Matsumoto, Takuya; Tanaka, Kazuo; Chujo, Yoshiki |
Journal of publication | RSC Adv. |
Year of publication | 2015 |
Journal volume | 5 |
Journal issue | 68 |
Pages of publication | 55406 |
a | 11.6396 ± 0.0007 Å |
b | 14.2359 ± 0.0009 Å |
c | 23.9678 ± 0.0016 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3971.5 ± 0.4 Å3 |
Cell temperature | 93 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.1402 |
Residual factor for significantly intense reflections | 0.0753 |
Weighted residual factors for significantly intense reflections | 0.1647 |
Weighted residual factors for all reflections included in the refinement | 0.1911 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.012 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
176428 (current) | 2016-02-13 | Replaced deprecated COD CIF data names with their more modern alternatives. The _cod_cif_authors_sg_Hall and _cod_cif_authors_sg_H-M data items were renamed to _cod_original_sg_symbol_Hall and _cod_cif_authors_sg_H-M respectively. |
7220860.cif |
139640 | 2015-06-25 | cif/ Adding structures of 7220859, 7220860 via cif-deposit CGI script. |
7220860.cif |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.