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Information card for entry 7222466
Preview
| Coordinates | 7222466.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H42 Cl2 Si Zr |
|---|---|
| Calculated formula | C32 H42 Cl2 Si Zr |
| SMILES | [c]123[c]4([c]5([c]67c(c(c(c([c]16[Zr]16893457([c]3([c]1([c]6([c]19c(c(c(c([c]831)C)C)C)C)C)C)[Si]2(C)C)(Cl)Cl)C)C)C)C)C)C |
| Title of publication | Synthesis and characterisation of permethylindenyl zirconium complexes and their use in ethylene polymerisation |
| Authors of publication | Buffet, Jean-Charles; Arnold, Thomas; Turner, Zoe; Angpanitcharoen, Phakpoom; OHare, Dermot |
| Journal of publication | RSC Adv. |
| Year of publication | 2015 |
| a | 14.1078 ± 0.0001 Å |
| b | 14.284 ± 0.0002 Å |
| c | 14.3753 ± 0.0002 Å |
| α | 90° |
| β | 96.894 ± 0.001° |
| γ | 90° |
| Cell volume | 2875.91 ± 0.06 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0345 |
| Residual factor for significantly intense reflections | 0.0295 |
| Weighted residual factors for significantly intense reflections | 0.0726 |
| Weighted residual factors for all reflections included in the refinement | 0.076 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.102 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 161208 (current) | 2015-10-09 | cif/ Adding structures of 7222465, 7222466, 7222467 via cif-deposit CGI script. |
7222466.cif |
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Users of the data should acknowledge the original authors of the
structural data.