Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7224152
Preview
| Coordinates | 7224152.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C5 H13 Cl N6 S2 |
|---|---|
| Calculated formula | C5 H13 Cl N6 S2 |
| Title of publication | Switchable dielectric constant in an inclusion compound bis(thiourea) imidazolium chloride |
| Authors of publication | Liu, Yu-Ling; Wang, Yu-Feng; Zhang, Wen |
| Journal of publication | CrystEngComm |
| Year of publication | 2016 |
| Journal volume | 18 |
| Journal issue | 11 |
| Pages of publication | 1958 |
| a | 14.75 ± 0.01 Å |
| b | 9.887 ± 0.01 Å |
| c | 8.419 ± 0.007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1227.8 ± 1.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 63 |
| Hermann-Mauguin space group symbol | C m c m |
| Hall space group symbol | -C 2c 2 |
| Residual factor for all reflections | 0.0585 |
| Residual factor for significantly intense reflections | 0.0556 |
| Weighted residual factors for significantly intense reflections | 0.1348 |
| Weighted residual factors for all reflections included in the refinement | 0.1372 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.077 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 181610 (current) | 2016-04-05 | cif/ Updating files of 7224152, 7224153, 7224154 Original log message: Adding full bibliography for 7224152--7224154.cif. |
7224152.cif |
| 176235 | 2016-02-06 | cif/ Adding structures of 7224152, 7224153, 7224154 via cif-deposit CGI script. |
7224152.cif |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.