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Information card for entry 7225294
Preview
| Coordinates | 7225294.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H26 N2 O4 S2 Zn |
|---|---|
| Calculated formula | C32 H26 N2 O4 S2 Zn |
| SMILES | c12c(c(C=O)cc(C)c2)O[Zn]2345[N](=C1)c1c([S]3CC[S]4c3c([N]2=Cc2c(c(C=O)cc(C)c2)O5)cccc3)cccc1 |
| Title of publication | Imine functionalized thioether Zn(II) turn-on fluorescent sensor and selective sequential logic operations with H2PO4-, DFT computation and live cell imaging |
| Authors of publication | Sinha, Chittaranjan; Patra, Chiranjit; Bhanja, Anup Kumar; Sen, Chandana; Ojha, Durbadal; Chattopadhyay, Debprasad; Mahapatra, Ambikesh |
| Journal of publication | RSC Adv. |
| Year of publication | 2016 |
| a | 25.7165 ± 0.0008 Å |
| b | 7.5044 ± 0.0002 Å |
| c | 16.189 ± 0.0005 Å |
| α | 90° |
| β | 113.067 ± 0.002° |
| γ | 90° |
| Cell volume | 2874.47 ± 0.15 Å3 |
| Cell temperature | 294 ± 2 K |
| Ambient diffraction temperature | 294 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0544 |
| Residual factor for significantly intense reflections | 0.0365 |
| Weighted residual factors for significantly intense reflections | 0.113 |
| Weighted residual factors for all reflections included in the refinement | 0.1269 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.857 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 183044 (current) | 2016-05-20 | cif/ Adding structures of 7225294 via cif-deposit CGI script. |
7225294.cif |
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