Crystallography Open Database

Information card for entry 7228328

Preview

Coordinates	7228328.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C74 H160 Co2 N8 O18 S4 Si4
Calculated formula	C74 H160 Co2 N8 O18 S4 Si4
SMILES	C(C)(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)S[Co]1([n]2ccn(c2)CCCCn2cc[n](c2)[Co]([n]2ccn(c2)CCCCn2cc[n]1c2)(S[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)S[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)S[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C.OC.OC.OC.OC.OC.OC
Title of publication	Structural, spectral and magnetic properties of Ni(II), Co(II) and Cd(II) compounds with imidazole derivatives and silanethiolate ligands
Authors of publication	Kowalkowska, Daria; Dołęga, Anna; Nedelko, Natalia; Hnatejko, Zbigniew; Ponikiewski, Łukasz; Matracka, Alicja; Ślawska-Waniewska, Anna; Strągowska, Alicja; Słowy, Klaudia; Gazda, Maria; Pladzyk, Agnieszka
Journal of publication	CrystEngComm
Year of publication	2017
a	11.947 ± 0.007 Å
b	15.36 ± 0.014 Å
c	15.374 ± 0.017 Å
α	90.85 ± 0.08°
β	112.01 ± 0.07°
γ	92.77 ± 0.06°
Cell volume	2611 ± 4 Å³
Cell temperature	120 ± 2 K
Ambient diffraction temperature	120 ± 2 K
Number of distinct elements	7
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.1406
Residual factor for significantly intense reflections	0.0671
Weighted residual factors for significantly intense reflections	0.1485
Weighted residual factors for all reflections included in the refinement	0.18
Goodness-of-fit parameter for all reflections included in the refinement	0.913
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
197011 (current)	2017-05-27	cif/ Adding structures of 7228324, 7228325, 7228326, 7228327, 7228328, 7228329 via cif-deposit CGI script.	7228328.cif