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Information card for entry 7228838
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| Coordinates | 7228838.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | (S,S)-Bis(2-hydroxypropylthio)(ethylenedithio) tetrathiafulvalene) bromide |
|---|---|
| Formula | C14 H18 Br O2 S8 |
| Calculated formula | C14 H18 Br O2 S8 |
| SMILES | [Br-].S1CCSC2=C1SC(S2)=C1SC(=C(S1)SC[C@@H](O)C)SC[C@@H](O)C |
| Title of publication | New semiconducting radical-cation salts of chiral bis(2-hydroxylpropylthio)ethylenedithio TTF |
| Authors of publication | Lopez, Jordan R.; Martin, Lee; Wallis, John D.; Akutsu, Hiroki; Yamada, Jun-ichi; Nakatsuji, Shin-ichi; Wilson, Claire; Christensen, Jeppe; Coles, Simon J. |
| Journal of publication | CrystEngComm |
| Year of publication | 2017 |
| a | 9.831 ± 0.0002 Å |
| b | 19.9437 ± 0.0004 Å |
| c | 10.6022 ± 0.0002 Å |
| α | 90° |
| β | 97.857 ± 0.002° |
| γ | 90° |
| Cell volume | 2059.22 ± 0.07 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0375 |
| Residual factor for significantly intense reflections | 0.0342 |
| Weighted residual factors for significantly intense reflections | 0.0741 |
| Weighted residual factors for all reflections included in the refinement | 0.0759 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 203412 (current) | 2017-11-21 | cif/7 Fixing Z values and formulae accordingly. |
7228838.cif |
| 199479 | 2017-08-03 | cif/ Adding structures of 7228833, 7228834, 7228835, 7228836, 7228837, 7228838 via cif-deposit CGI script. |
7228838.cif |
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Users of the data should acknowledge the original authors of the
structural data.