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Information card for entry 7233549
Preview
| Coordinates | 7233549.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H13 N3 O |
|---|---|
| Calculated formula | C19 H13 N3 O |
| SMILES | o1c(c2ccc(/N=C/c3ccncc3)cc2)nc2c1cccc2 |
| Title of publication | Schiff base particles with aggregation-induced enhanced emission: random aggregation preventing pi-pi stacking |
| Authors of publication | Lianke Wang; Zheng Zheng; Zhipeng Yu; Jun Zheng; Min Fang; Jieying Wu; Yupeng Tian; Hongping Zhou |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2012 |
| Journal volume | 1 |
| Pages of publication | 6952 - 6959 |
| a | 10.969 ± 0.005 Å |
| b | 7.342 ± 0.005 Å |
| c | 36.533 ± 0.005 Å |
| α | 90 ± 0.005° |
| β | 90 ± 0.005° |
| γ | 90 ± 0.005° |
| Cell volume | 2942 ± 2 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0457 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for significantly intense reflections | 0.1133 |
| Weighted residual factors for all reflections included in the refinement | 0.1275 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 217828 (current) | 2019-08-29 | cif/ Adding structures of 7233549 via cif-deposit CGI script. |
7233549.cif |
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