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Information card for entry 7233952
Preview
| Coordinates | 7233952.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H46 N2 O2 S4 |
|---|---|
| Calculated formula | C44 H46 N2 O2 S4 |
| Title of publication | The impact of molecular planarity on electronic devices in thienoisoindigo-based organic semiconductors |
| Authors of publication | Takefumi Odajima; Minoru Ashizawa; Yuichi Konosu; Hidetoshi Matsumoto; Takehiko Mori |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2014 |
| Journal volume | 2 |
| Pages of publication | 10455 - 10467 |
| a | 5.21365 ± 0.00013 Å |
| b | 12.5465 ± 0.0003 Å |
| c | 16.7656 ± 0.0004 Å |
| α | 110.319 ± 0.0014° |
| β | 92.1751 ± 0.0015° |
| γ | 106.122 ± 0.0014° |
| Cell volume | 976.95 ± 0.04 Å3 |
| Cell temperature | 296 K |
| Ambient diffraction temperature | 296 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for significantly intense reflections | 0.1344 |
| Weighted residual factors for all reflections included in the refinement | 0.403 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.539 |
| Diffraction radiation wavelength | 1.54187 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 218535 (current) | 2019-09-19 | cif/ Adding structures of 7233952 via cif-deposit CGI script. |
7233952.cif |
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Users of the data should acknowledge the original authors of the
structural data.