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Information card for entry 7234274
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| Coordinates | 7234274.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | C6-BADTDK |
|---|---|
| Chemical name | 2,8-Dihexyl-6,12-dihydro-6,12-ethanoanthra[1,2-b:5,6-b']dithiophene-13,14-dione |
| Formula | C32 H34 O2 S2 |
| Calculated formula | C32 H34 O2 S2 |
| Title of publication | Evaluation of semiconducting molecular thin films solution-processed via the photoprecursor approach: the case of hexyl-substituted thienoanthracenes |
| Authors of publication | Cassandre Quinton; Mitsuharu Suzuki; Yoshitaka Kaneshige; Yuki Tatenaka; Chiho Katagiri; Yuji Yamaguchi; Daiki Kuzuhara; Naoki Aratani; Ken-ichi Nakayama; Hiroko Yamada |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2015 |
| Journal volume | 3 |
| Pages of publication | 5995 - 6005 |
| a | 12.47 ± 0.0005 Å |
| b | 13.7514 ± 0.0005 Å |
| c | 16.2964 ± 0.0006 Å |
| α | 90° |
| β | 105.061 ± 0.0008° |
| γ | 90° |
| Cell volume | 2698.52 ± 0.18 Å3 |
| Cell temperature | 103 K |
| Ambient diffraction temperature | 103 K |
| Number of distinct elements | 4 |
| Space group number | 13 |
| Hermann-Mauguin space group symbol | P 1 2/c 1 |
| Hall space group symbol | -P 2yc |
| Residual factor for significantly intense reflections | 0.0589 |
| Weighted residual factors for all reflections included in the refinement | 0.1559 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 218962 (current) | 2019-10-01 | cif/ Adding structures of 7234272, 7234273, 7234274 via cif-deposit CGI script. |
7234274.cif |
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Users of the data should acknowledge the original authors of the
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