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Information card for entry 7236565
Preview
| Coordinates | 7236565.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H25 O8 Pb6 S12 |
|---|---|
| Calculated formula | C36 H24.3334 O8 Pb6 S12 |
| Title of publication | A semiconducting gyroidal metal-sulfur framework for chemiresistive sensing |
| Authors of publication | Huang, Jiahong; He, Yonghe; Yao, Ming-Shui; He, Jun; Xu, Gang; Zeller, Matthias; Xu, Zhengtao |
| Journal of publication | Journal of Materials Chemistry A |
| Year of publication | 2017 |
| Journal volume | 5 |
| Journal issue | 31 |
| Pages of publication | 16139 |
| a | 19.8841 ± 0.0001 Å |
| b | 19.8841 ± 0.0001 Å |
| c | 19.8841 ± 0.0001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7861.72 ± 0.07 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 205 |
| Hermann-Mauguin space group symbol | P a -3 |
| Hall space group symbol | -P 2ac 2ab 3 |
| Residual factor for all reflections | 0.0699 |
| Residual factor for significantly intense reflections | 0.0574 |
| Weighted residual factors for significantly intense reflections | 0.1424 |
| Weighted residual factors for all reflections included in the refinement | 0.1535 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.087 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 236309 (current) | 2019-11-24 | cif/ Adding structures of 7236565 via cif-deposit CGI script. |
7236565.cif |
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Users of the data should acknowledge the original authors of the
structural data.