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Information card for entry 7240029
Preview
| Coordinates | 7240029.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H28 N4 Ni O9 |
|---|---|
| Calculated formula | C32 H28 N4 Ni O9 |
| Title of publication | Five naphthalene-amide-bridged Ni(ii) complexes: electrochemistry, bifunctional fluorescence responses, removal of contaminants and optimization by CVD |
| Authors of publication | Zhao, Jing; Luan, Jian; Yu, Huixuan; Liu, Guocheng; Lin, Hongyan; Wang, Xiuli; Chen, Baokuan |
| Journal of publication | CrystEngComm |
| Year of publication | 2020 |
| Journal volume | 22 |
| Journal issue | 8 |
| Pages of publication | 1330 - 1339 |
| a | 21.551 ± 0.002 Å |
| b | 7.2511 ± 0.0007 Å |
| c | 20.83 ± 0.0018 Å |
| α | 90° |
| β | 117.421 ± 0.001° |
| γ | 90° |
| Cell volume | 2889.4 ± 0.5 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0729 |
| Residual factor for significantly intense reflections | 0.0715 |
| Weighted residual factors for significantly intense reflections | 0.1717 |
| Weighted residual factors for all reflections included in the refinement | 0.1723 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 257443 (current) | 2020-10-06 | cif/ Updating files of 7240025, 7240026, 7240027, 7240028, 7240029 Original log message: Adding full bibliography for 7240025--7240029.cif. |
7240029.cif |
| 248756 | 2020-03-04 | cif/ Adding structures of 7240025, 7240026, 7240027, 7240028, 7240029 via cif-deposit CGI script. |
7240029.cif |
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Users of the data should acknowledge the original authors of the
structural data.