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Information card for entry 7241296
Preview
| Coordinates | 7241296.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H11 F3 N3 O |
|---|---|
| Calculated formula | C20 H11 F3 N3 O |
| SMILES | c1(ccc2Oc3cccc4c3N([N]C(=N4)c3ccccc3)c2c1)C(F)(F)F |
| Title of publication | UV-photoelectron spectroscopy of stable radicals: the electronic structure of planar Blatter radicals as materials for organic electronics. |
| Authors of publication | Hande, Aniket A.; Darrigan, Clovis; Bartos, Paulina; Baylère, Patrick; Pietrzak, Anna; Kaszyński, Piotr; Chrostowska, Anna |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2020 |
| Journal volume | 22 |
| Journal issue | 41 |
| Pages of publication | 23637 - 23644 |
| a | 7.5809 ± 0.0002 Å |
| b | 19.0996 ± 0.0002 Å |
| c | 11.1263 ± 0.0003 Å |
| α | 90° |
| β | 104.022 ± 0.002° |
| γ | 90° |
| Cell volume | 1563 ± 0.06 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0367 |
| Residual factor for significantly intense reflections | 0.0352 |
| Weighted residual factors for significantly intense reflections | 0.102 |
| Weighted residual factors for all reflections included in the refinement | 0.1036 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 258984 (current) | 2020-11-06 | cif/ Updating files of 7241296 Original log message: Adding full bibliography for 7241296.cif. |
7241296.cif |
| 256706 | 2020-09-24 | cif/ Adding structures of 7241296 via cif-deposit CGI script. |
7241296.cif |
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Users of the data should acknowledge the original authors of the
structural data.