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Information card for entry 7243725
Preview
| Coordinates | 7243725.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H8 Br4 O2 |
|---|---|
| Calculated formula | C24 H8 Br4 O2 |
| SMILES | Brc1c2c3c(C(=O)C(=C\4c5c6c(c(Br)cc5)c(Br)ccc6C4=O)/c3cc1)ccc2Br |
| Title of publication | Halogen bonding vs. π-stacking interactions in new bis(acenaphthylene)dione semiconductors |
| Authors of publication | Liu, Ying-Hsuan; Dadvand, Afshin; Titi, Hatem M.; Hamzehpoor, Ehsan; Perepichka, Dmitrii F. |
| Journal of publication | CrystEngComm |
| Year of publication | 2021 |
| Journal volume | 23 |
| Journal issue | 47 |
| Pages of publication | 8255 - 8259 |
| a | 31.7745 ± 0.0016 Å |
| b | 3.8742 ± 0.0002 Å |
| c | 15.4074 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1896.66 ± 0.18 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0805 |
| Residual factor for significantly intense reflections | 0.0582 |
| Weighted residual factors for significantly intense reflections | 0.1448 |
| Weighted residual factors for all reflections included in the refinement | 0.1648 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 271832 (current) | 2022-01-06 | cif/ Updating files of 7243723, 7243724, 7243725 Original log message: Adding full bibliography for 7243723--7243725.cif. |
7243725.cif |
| 269891 | 2021-10-12 | cif/ Adding structures of 7243723, 7243724, 7243725 via cif-deposit CGI script. |
7243725.cif |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
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Users of the data should acknowledge the original authors of the
structural data.