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Information card for entry 7245318
Preview
| Coordinates | 7245318.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H14 S6 |
|---|---|
| Calculated formula | C12 H14 S6 |
| SMILES | S1C2=C(SC1=C1SC=CS1)S[C@H]([C@@H](S2)CC)CC.S1C2=C(SC(S2)=C2SC=CS2)S[C@@H]([C@H]1CC)CC |
| Title of publication | Chiral diethyl-EDT-TTF and tetraethyl-BEDT-TTF: synthesis, structural characterization, radical cation salt and charge transfer complexes |
| Authors of publication | Mroweh, Nabil; Cauchy, Thomas; Vanthuyne, Nicolas; Avarvari, Narcis |
| Journal of publication | CrystEngComm |
| Year of publication | 2022 |
| a | 31.2707 ± 0.0011 Å |
| b | 9.2527 ± 0.0004 Å |
| c | 10.954 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3169.4 ± 0.2 Å3 |
| Cell temperature | 297 ± 1 K |
| Ambient diffraction temperature | 297 ± 1 K |
| Number of distinct elements | 3 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0568 |
| Residual factor for significantly intense reflections | 0.0441 |
| Weighted residual factors for significantly intense reflections | 0.1032 |
| Weighted residual factors for all reflections included in the refinement | 0.1136 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 295543 (current) | 2024-10-18 | cif/7: Fixing Z values and formulae |
7245318.cif |
| 277262 | 2022-08-17 | cif/ Adding structures of 7245316, 7245317, 7245318, 7245319, 7245320, 7245321, 7245322, 7245323, 7245324, 7245325 via cif-deposit CGI script. |
7245318.cif |
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Users of the data should acknowledge the original authors of the
structural data.