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Information card for entry 7247440
Preview
| Coordinates | 7247440.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33 H25 Fe N O2 |
|---|---|
| Calculated formula | C33 H25 Fe N O2 |
| SMILES | [Fe]12345678([cH]9[cH]4[cH]3[cH]2[cH]19)[c]1([cH]8[cH]7[cH]6[cH]51)c1ccc(cc1)c1ccc2nc(cc(c2c1)C(=O)OC)c1ccccc1 |
| Title of publication | Efficient ternary WORM memory devices from quinoline-based D–A systems by varying the redox behavior of ferrocene |
| Authors of publication | Angela, Varghese Maria; Harshini, Deivendran; Imran, Predhanekar Mohamed; Bhuvanesh, Nattamai. S. P.; Nagarajan, Samuthira |
| Journal of publication | RSC Advances |
| Year of publication | 2023 |
| Journal volume | 13 |
| Journal issue | 41 |
| Pages of publication | 28416 - 28425 |
| a | 16.5928 ± 0.0005 Å |
| b | 7.2752 ± 0.0002 Å |
| c | 39.3538 ± 0.0012 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4750.6 ± 0.2 Å3 |
| Cell temperature | 110 K |
| Ambient diffraction temperature | 110 K |
| Number of distinct elements | 5 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0516 |
| Residual factor for significantly intense reflections | 0.0458 |
| Weighted residual factors for significantly intense reflections | 0.11 |
| Weighted residual factors for all reflections included in the refinement | 0.1143 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 286551 (current) | 2023-09-27 | cif/ Adding structures of 7247440 via cif-deposit CGI script. |
7247440.cif |
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Users of the data should acknowledge the original authors of the
structural data.