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Information card for entry 7248316
Preview
| Coordinates | 7248316.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H20 Br4 Hg N2 O2 |
|---|---|
| Calculated formula | C16 H20 Br4 Hg N2 O2 |
| Title of publication | Crystal structure, Hirshfeld surface analysis, conduction mechanism and electrical modulus study of the new organic-inorganic compound [C<sub>8</sub>H<sub>10</sub>NO]<sub>2</sub>HgBr<sub>4</sub>. |
| Authors of publication | Chkoundali, Souad; Garoui, Iheb; Trigui, Wala; Oueslati, Abderrazek |
| Journal of publication | RSC advances |
| Year of publication | 2024 |
| Journal volume | 14 |
| Journal issue | 13 |
| Pages of publication | 8971 - 8980 |
| a | 20.8238 ± 0.0019 Å |
| b | 15.3516 ± 0.0014 Å |
| c | 13.7001 ± 0.0014 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4379.6 ± 0.7 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 64 |
| Hermann-Mauguin space group symbol | C m c e |
| Hall space group symbol | -C 2ac 2 |
| Residual factor for all reflections | 0.0168 |
| Residual factor for significantly intense reflections | 0.015 |
| Weighted residual factors for significantly intense reflections | 0.0345 |
| Weighted residual factors for all reflections included in the refinement | 0.0352 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.113 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 290535 (current) | 2024-03-19 | cif/ Adding structures of 7248316 via cif-deposit CGI script. |
7248316.cif |
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Users of the data should acknowledge the original authors of the
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