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Information card for entry 7701996
Preview
| Coordinates | 7701996.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C35 H45 F12 Na Ni O11 P2 Sb2 |
|---|---|
| Calculated formula | C35 H45 F12 Na Ni O11 P2 Sb2 |
| SMILES | c12ccccc1[P]1(=[O][Ni]34([P]2(c2c(cccc2OC)OC)c2c(cccc2OC)OC)C[CH]3=[CH2]4)OCC[O]2[Na]34([F][Sb]([F]3)(F)(F)(F)F)([O](CC2)C)[O](CCO1)CC[O]4C.[F-][Sb](F)(F)(F)(F)F |
| Title of publication | Accelerating Ethylene Polymerization Using Secondary Metal Ions in Tetrahydrofuran |
| Authors of publication | Xiao, Dawei; Cai, Zhongzheng; Do, Loi |
| Journal of publication | Dalton Transactions |
| Year of publication | 2019 |
| a | 40.567 ± 0.003 Å |
| b | 9.3711 ± 0.0007 Å |
| c | 29.875 ± 0.002 Å |
| α | 90° |
| β | 121.95 ± 0.001° |
| γ | 90° |
| Cell volume | 9636.7 ± 1.2 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0741 |
| Residual factor for significantly intense reflections | 0.0567 |
| Weighted residual factors for significantly intense reflections | 0.1547 |
| Weighted residual factors for all reflections included in the refinement | 0.1723 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 231189 (current) | 2019-11-22 | cif/ Adding structures of 7701996, 7701997, 7701998 via cif-deposit CGI script. |
7701996.cif |
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Users of the data should acknowledge the original authors of the
structural data.