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Information card for entry 7701998
Preview
| Coordinates | 7701998.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37.47 H54.87 F12 Na Ni O9.53 P2 Sb2 |
|---|---|
| Calculated formula | C37.47 H54.88 F12 Na Ni O9.53 P2 Sb2 |
| SMILES | c12ccccc1[P](c1ccccc1OC)([Ni]13([CH2]=[CH]1C3)[O]=[P]12OCC[O]2CC[O](C)[Na]342([F][Sb](F)(F)(F)(F)F)([F][Sb](F)(F)(F)(F)F)[O](CC[O]14)CC[O]3C)c1c(cccc1)OC.CCCCO |
| Title of publication | Accelerating Ethylene Polymerization Using Secondary Metal Ions in Tetrahydrofuran |
| Authors of publication | Xiao, Dawei; Cai, Zhongzheng; Do, Loi |
| Journal of publication | Dalton Transactions |
| Year of publication | 2019 |
| a | 10.2493 ± 0.0017 Å |
| b | 15.708 ± 0.003 Å |
| c | 17.072 ± 0.003 Å |
| α | 97.691 ± 0.002° |
| β | 105.207 ± 0.002° |
| γ | 108.91 ± 0.002° |
| Cell volume | 2436 ± 0.8 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0887 |
| Residual factor for significantly intense reflections | 0.0731 |
| Weighted residual factors for significantly intense reflections | 0.2113 |
| Weighted residual factors for all reflections included in the refinement | 0.2261 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 231189 (current) | 2019-11-22 | cif/ Adding structures of 7701996, 7701997, 7701998 via cif-deposit CGI script. |
7701998.cif |
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Users of the data should acknowledge the original authors of the
structural data.