Crystallography Open Database  
  
  - COD Home
 - Accessing COD Data
 - Add Your Data
 - Documentation
 
Information card for entry 7708405
Preview
| Coordinates | 7708405.cif | 
|---|---|
| Original paper (by DOI) | HTML | 
| Formula | C34 H86 O4 Si6 Sn2 Yb | 
|---|---|
| Calculated formula | C34 H86 O4 Si6 Sn2 Yb | 
| Title of publication | Bonding analysis in ytterbium(ii) distannyl and related tetryls | 
| Authors of publication | Chapple, Peter M.; Cartron, Julien; Hamdoun, Ghanem; Cordier, Marie; Kahlal, Samia; Oulyadi, Hassan; Carpentier, Jean-François; Saillard, Jean-Yves; Sarazin, Yann | 
| Journal of publication | Dalton Transactions | 
| Year of publication | 2021 | 
| a | 13.2657 ± 0.0008 Å | 
| b | 19.8289 ± 0.0011 Å | 
| c | 40.652 ± 0.002 Å | 
| α | 90° | 
| β | 90° | 
| γ | 90° | 
| Cell volume | 10693.3 ± 1 Å3 | 
| Cell temperature | 150 K | 
| Ambient diffraction temperature | 150 K | 
| Number of distinct elements | 6 | 
| Space group number | 61 | 
| Hermann-Mauguin space group symbol | P b c a | 
| Hall space group symbol | -P 2ac 2ab | 
| Residual factor for all reflections | 0.0577 | 
| Residual factor for significantly intense reflections | 0.0378 | 
| Weighted residual factors for significantly intense reflections | 0.0739 | 
| Weighted residual factors for all reflections included in the refinement | 0.0801 | 
| Goodness-of-fit parameter for all reflections included in the refinement | 1.151 | 
| Diffraction radiation probe | x-ray | 
| Diffraction radiation wavelength | 0.71073 Å | 
| Diffraction radiation type | MoKα | 
| Has coordinates | Yes | 
| Has disorder | Yes | 
| Has Fobs | No | 
| Revision | Date | Message | Files | 
|---|---|---|---|
| 269278 (current) | 2021-09-24 | cif/ Adding structures of 7708404, 7708405 via cif-deposit CGI script.  | 
	7708405.cif | 
          All data in the COD and the database itself are dedicated to the
          public domain and licensed under the
          
    CC0
    License
.
          Users of the data should acknowledge the original authors of the
          structural data.