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Information card for entry 7709404
Preview
| Coordinates | 7709404.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H40 N4 Si4 Sn |
|---|---|
| Calculated formula | C20 H40 N4 Si4 Sn |
| SMILES | [Sn]1([N]([Si](C)(C)C)=C(N1[Si](C)(C)C)c1cc(C#N)ccc1)N([Si](C)(C)C)[Si](C)(C)C |
| Title of publication | Reversible addition of tin(II) amides to nitriles. |
| Authors of publication | Chlupatý, Tomáš; Brichová, Kristýna; Samsonov, Maksim A.; R°užičková, Zdeňka; R°užička, Aleš |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2022 |
| Journal volume | 51 |
| Journal issue | 5 |
| Pages of publication | 1879 - 1887 |
| a | 10.162 ± 0.0004 Å |
| b | 11.219 ± 0.0006 Å |
| c | 14.3991 ± 0.001 Å |
| α | 68.279 ± 0.005° |
| β | 73.507 ± 0.004° |
| γ | 80.199 ± 0.004° |
| Cell volume | 1458.38 ± 0.15 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0521 |
| Residual factor for significantly intense reflections | 0.0423 |
| Weighted residual factors for significantly intense reflections | 0.0949 |
| Weighted residual factors for all reflections included in the refinement | 0.0992 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.233 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 272405 (current) | 2022-02-02 | cif/ Adding structures of 7709403, 7709404 via cif-deposit CGI script. |
7709404.cif |
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Users of the data should acknowledge the original authors of the
structural data.