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Information card for entry 7710868
Preview
| Coordinates | 7710868.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H64 O4 V |
|---|---|
| Calculated formula | C48 H64 O4 V |
| SMILES | [V]12(Oc3c(C(C)(C)C)cc(c(c3c3c(O2)c(cc(c3C)C)C(C)(C)C)C)C)Oc2c(c(c(cc2C(C)(C)C)C)C)c2c(O1)c(cc(c2C)C)C(C)(C)C |
| Title of publication | Synthesis, Crystal Structure, EPR, and DFT Studies of an Unusually Distorted Vanadium(II) Complex |
| Authors of publication | Bonitatibus, Peter John; Alvarez, Santiago; Armstrong, William H.; Baldansuren, Amgalanbaatar; Gaspard, Mallory E.; Lakshmi, K. V.; Ziegler, Micah S.; Charles, Philip |
| Journal of publication | Dalton Transactions |
| Year of publication | 2022 |
| a | 10.1309 ± 0.0004 Å |
| b | 24.5283 ± 0.0009 Å |
| c | 18.0181 ± 0.0007 Å |
| α | 90° |
| β | 100.636 ± 0.001° |
| γ | 90° |
| Cell volume | 4400.5 ± 0.3 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1517 |
| Residual factor for significantly intense reflections | 0.0895 |
| Weighted residual factors for significantly intense reflections | 0.1481 |
| Weighted residual factors for all reflections included in the refinement | 0.1698 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.122 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 277006 (current) | 2022-07-30 | cif/ Adding structures of 7710868, 7710869 via cif-deposit CGI script. |
7710868.cif |
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Users of the data should acknowledge the original authors of the
structural data.