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Information card for entry 8105864
Preview
| Coordinates | 8105864.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H66 N4 O8 P4 S8 Zn2 |
|---|---|
| Calculated formula | C36 H66 N4 O8 P4 S8 Zn2 |
| Title of publication | Crystal structure of tetrakis(O,O′-diisopropyldithiophosphato-κ2 S,S′)-(μ2-1,2-bis(4-pyridylmethylene)hydrazine-κ2 N:N′)zinc(II), C36H66N4O8P4S8Zn2 |
| Authors of publication | Tan, Yee Seng; Tiekink, Edward R.T. |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2019 |
| Journal volume | 234 |
| Journal issue | 4 |
| Pages of publication | 827 - 829 |
| a | 7.9496 ± 0.0001 Å |
| b | 11.5638 ± 0.0002 Å |
| c | 16.5616 ± 0.0002 Å |
| α | 75.604 ± 0.001° |
| β | 86.321 ± 0.001° |
| γ | 83.103 ± 0.002° |
| Cell volume | 1463.06 ± 0.04 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.045 |
| Residual factor for significantly intense reflections | 0.0424 |
| Weighted residual factors for significantly intense reflections | 0.1057 |
| Weighted residual factors for all reflections included in the refinement | 0.1072 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.176 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 278172 (current) | 2022-09-26 | cif/ Adding structures of 8105864 via cif-deposit CGI script. |
8105864.cif |
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