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Information card for entry 8106735
Preview
| Coordinates | 8106735.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H32 N2 Pd Se14 |
|---|---|
| Calculated formula | C12 H32 N2 Pd Se14 |
| Title of publication | Crystal structure of bis(N,N,N-ethyldimethylethanaminium) bis(heptaselenido-κ 2 Se 1,Se 7)palladate(II), C12H32N2PdSe14 |
| Authors of publication | Kim, Kang-Woo; Wang, Di |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2017 |
| Journal volume | 232 |
| Journal issue | 6 |
| Pages of publication | 965 - 967 |
| a | 9.2236 ± 0.0009 Å |
| b | 15.1503 ± 0.0014 Å |
| c | 12.2198 ± 0.0012 Å |
| α | 90° |
| β | 109.683 ± 0.002° |
| γ | 90° |
| Cell volume | 1607.8 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0641 |
| Residual factor for significantly intense reflections | 0.0397 |
| Weighted residual factors for significantly intense reflections | 0.0873 |
| Weighted residual factors for all reflections included in the refinement | 0.0958 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.003 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 280838 (current) | 2023-02-09 | cif/ Adding structures of 8106735 via cif-deposit CGI script. |
8106735.cif |
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Users of the data should acknowledge the original authors of the
structural data.