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Information card for entry 8106890
Preview
| Coordinates | 8106890.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | (E)-4-(2-(4-(diethylamino)phenyl)diazen-1-ium-1-yl)benzenesulfonate monohydrate |
|---|---|
| Formula | C16 H21 N3 O4 S |
| Calculated formula | C16 H21 N3 O4 S |
| SMILES | S(=O)(=O)([O-])c1ccc([NH+]=Nc2ccc(N(CC)CC)cc2)cc1.O |
| Title of publication | Crystal structure of (E)-4-(2-(4-(diethylamino)phenyl)diazen-1-ium-1-yl)benzenesulfonate monohydrate |
| Authors of publication | Oh, In-Hwan; Park, Seong-Hun |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2016 |
| Journal volume | 231 |
| Journal issue | 2 |
| Pages of publication | 409 - 410 |
| a | 8.402 ± 0.002 Å |
| b | 9.035 ± 0.002 Å |
| c | 11.692 ± 0.003 Å |
| α | 102.382 ± 0.004° |
| β | 109.303 ± 0.004° |
| γ | 97.122 ± 0.004° |
| Cell volume | 799.7 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0552 |
| Residual factor for significantly intense reflections | 0.041 |
| Weighted residual factors for significantly intense reflections | 0.1078 |
| Weighted residual factors for all reflections included in the refinement | 0.1172 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 281763 (current) | 2023-03-09 | cif/ Adding structures of 8106890 via cif-deposit CGI script. |
8106890.cif |
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Users of the data should acknowledge the original authors of the
structural data.