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Information card for entry 4000818
Preview
| Coordinates | 4000818.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Hg3 Se4 Tl2 |
|---|---|
| Calculated formula | Hg3 Se4 Tl2 |
| Title of publication | Tl2Hg3Q4(Q = S, Se, and Te): High-Density, Wide-Band-Gap Semiconductors |
| Authors of publication | Johnsen, Simon; Peter, Sebastian C.; Nguyen, Sandy L.; Song, Jung-Hwan; Jin, Hosub; Freeman, Arthur J.; Kanatzidis, Mercouri G. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2011 |
| Journal volume | 23 |
| Journal issue | 19 |
| Pages of publication | 4375 |
| a | 11.977 ± 0.002 Å |
| b | 6.9264 ± 0.0014 Å |
| c | 13.203 ± 0.003 Å |
| α | 90° |
| β | 116.36 ± 0.03° |
| γ | 90° |
| Cell volume | 981.4 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0705 |
| Residual factor for significantly intense reflections | 0.0589 |
| Weighted residual factors for significantly intense reflections | 0.1307 |
| Weighted residual factors for all reflections included in the refinement | 0.1358 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.179 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 178377 (current) | 2016-03-21 | cif/4/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/00. |
4000818.cif |
| 91935 | 2013-12-29 | cod/ (saulius@koala.ibt.lt) Adding DOIs that could be assigned unambiguously to the rest of COD CIFs. |
4000818.cif |
| 34976 | 2012-02-26 | ../uploads/cif-deposit/cod/cif Adding structures of 4000817, 4000818, 4000819 via cif-deposit CGI script. |
4000818.cif |
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Users of the data should acknowledge the original authors of the
structural data.