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Information card for entry 4000819
Preview
Coordinates | 4000819.cif |
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Original paper (by DOI) | HTML |
Formula | Hg3 Te4 Tl2 |
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Calculated formula | Hg3 Te4 Tl2 |
Title of publication | Tl2Hg3Q4(Q = S, Se, and Te): High-Density, Wide-Band-Gap Semiconductors |
Authors of publication | Johnsen, Simon; Peter, Sebastian C.; Nguyen, Sandy L.; Song, Jung-Hwan; Jin, Hosub; Freeman, Arthur J.; Kanatzidis, Mercouri G. |
Journal of publication | Chemistry of Materials |
Year of publication | 2011 |
Journal volume | 23 |
Journal issue | 19 |
Pages of publication | 4375 |
a | 12.648 ± 0.003 Å |
b | 7.3574 ± 0.0015 Å |
c | 13.701 ± 0.003 Å |
α | 90° |
β | 117.48 ± 0.03° |
γ | 90° |
Cell volume | 1131.1 ± 0.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0731 |
Residual factor for significantly intense reflections | 0.0513 |
Weighted residual factors for significantly intense reflections | 0.0973 |
Weighted residual factors for all reflections included in the refinement | 0.1032 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.1 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
178377 (current) | 2016-03-21 | cif/4/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/00. |
4000819.cif |
91935 | 2013-12-29 | cod/ (saulius@koala.ibt.lt) Adding DOIs that could be assigned unambiguously to the rest of COD CIFs. |
4000819.cif |
34976 | 2012-02-26 | ../uploads/cif-deposit/cod/cif Adding structures of 4000817, 4000818, 4000819 via cif-deposit CGI script. |
4000819.cif |
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Users of the data should acknowledge the original authors of the
structural data.