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Information card for entry 1543247
Preview
| Coordinates | 1543247.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H35 N5 O Si |
|---|---|
| Calculated formula | C34 H35 N5 O Si |
| SMILES | [Si]123(n4cccc4C=[N]2c2ccccc2[N]3=Cc2n1ccc2)(c1ccccc1)c1ccc(N(C)C)cc1.O1CCCC1 |
| Title of publication | Hexacoordinate Silicon Compounds with a Dianionic Tetradentate (N,N′,N′,N)-Chelating Ligand |
| Authors of publication | Gerlach, Daniela; Brendler, Erica; Wagler, Jörg |
| Journal of publication | Inorganics |
| Year of publication | 2016 |
| Journal volume | 4 |
| Journal issue | 2 |
| Pages of publication | 8 |
| a | 14.5651 ± 0.0007 Å |
| b | 22.872 ± 0.0008 Å |
| c | 10.4529 ± 0.0005 Å |
| α | 90° |
| β | 124.37 ± 0.003° |
| γ | 90° |
| Cell volume | 2874.2 ± 0.2 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0381 |
| Residual factor for significantly intense reflections | 0.0331 |
| Weighted residual factors for significantly intense reflections | 0.08 |
| Weighted residual factors for all reflections included in the refinement | 0.0831 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 182552 (current) | 2016-05-04 | cif/ Adding structures of 1543247 via cif-deposit CGI script. |
1543247.cif |
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Users of the data should acknowledge the original authors of the
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