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Information card for entry 1543248
Preview
| Coordinates | 1543248.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H30 N4 O Si |
|---|---|
| Calculated formula | C32 H30 N4 O Si |
| SMILES | [Si]123(n4cccc4C=[N]1c1ccccc1[N]2=Cc1n3ccc1)(c1ccccc1)c1ccccc1.O1CCCC1 |
| Title of publication | Hexacoordinate Silicon Compounds with a Dianionic Tetradentate (N,N′,N′,N)-Chelating Ligand |
| Authors of publication | Gerlach, Daniela; Brendler, Erica; Wagler, Jörg |
| Journal of publication | Inorganics |
| Year of publication | 2016 |
| Journal volume | 4 |
| Journal issue | 2 |
| Pages of publication | 8 |
| a | 9.7135 ± 0.0003 Å |
| b | 14.9827 ± 0.0004 Å |
| c | 18.4932 ± 0.0004 Å |
| α | 82.491 ± 0.001° |
| β | 83.162 ± 0.001° |
| γ | 88.353 ± 0.001° |
| Cell volume | 2649.1 ± 0.12 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.079 |
| Residual factor for significantly intense reflections | 0.0463 |
| Weighted residual factors for significantly intense reflections | 0.114 |
| Weighted residual factors for all reflections included in the refinement | 0.1241 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 182553 (current) | 2016-05-04 | cif/ Adding structures of 1543248 via cif-deposit CGI script. |
1543248.cif |
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