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Information card for entry 4002989
Preview
| Coordinates | 4002989.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Li3.83 P0.2 S4 Si0.8 |
|---|---|
| Calculated formula | Li3.82 P0.2 S4 Si0.8 |
| Title of publication | An Entropically Stabilized Fast-Ion Conductor: Li3.25[Si0.25P0.75]S4 |
| Authors of publication | Zhou, Laidong; Assoud, Abdeljalil; Shyamsunder, Abhinandan; Huq, Ashfia; Zhang, Qiang; Hartmann, Pascal; Kulisch, Joern; Nazar, Linda F. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2019 |
| Journal volume | 31 |
| Journal issue | 19 |
| Pages of publication | 7801 |
| a | 6.112 ± 0.002 Å |
| b | 7.781 ± 0.003 Å |
| c | 6.88 ± 0.003 Å |
| α | 90° |
| β | 91.147 ± 0.009° |
| γ | 90° |
| Cell volume | 327.1 ± 0.2 Å3 |
| Cell temperature | 280 ± 2 K |
| Ambient diffraction temperature | 280 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 11 |
| Hermann-Mauguin space group symbol | P 1 21/m 1 |
| Hall space group symbol | -P 2yb |
| Residual factor for all reflections | 0.065 |
| Residual factor for significantly intense reflections | 0.048 |
| Weighted residual factors for significantly intense reflections | 0.1146 |
| Weighted residual factors for all reflections included in the refinement | 0.1216 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.117 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 220413 (current) | 2019-10-29 | cif/ Adding structures of 4002989 via cif-deposit CGI script. |
4002989.cif |
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